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Patent Searching and Data


Title:
HIGH ACCURACY SIGNAL PHASE DIFFERENCE MEASUREMENT SYSTEM
Document Type and Number:
Japanese Patent JP2001349911
Kind Code:
A
Abstract:

To provide a technology of measuring the phase difference between synchronous signals with high accuracy.

This system has an integrated circuit device for comparing the relative phases of first and second signals with each other with very high accuracy. This system has a first input for receiving the first signal provided with a first edge and a second input for receiving the second signal provided with a second edge. A first delay chain has at least one first delay element, and a second delay chain has at least one second delay element. At least one symmetric flip flop has the first and second inputs connected to each output tap of the first and second delay elements, and the output of the flip flop indicates which of the first and second edges reaches the first and second inputs first.


Inventors:
ELLIOT WILLIAM D
Application Number:
JP2001085086A
Publication Date:
December 21, 2001
Filing Date:
March 23, 2001
Export Citation:
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Assignee:
ST MICROELECTRONICS INC
International Classes:
G01R25/00; G02F1/133; G06F1/04; G09G3/20; G09G5/00; H03K5/26; H03L7/06; H03L7/081; H03L7/085; H04N5/12; H04N5/66; (IPC1-7): G01R25/00; G02F1/133; H03K5/26; H03L7/06; H04N5/12
Attorney, Agent or Firm:
Kazuo Kobashi (1 person outside)