Title:
高倍率顕微観測装置
Document Type and Number:
Japanese Patent JP3754958
Kind Code:
B2
Abstract:
A highly visible marker or the like is attached to the slide glass, stage or he like of a microscope and pattern image recognition is utilized, whereby a more accurate full closed controller which does not require the conventional expensive length measuring scale, and work prepared by using the same are realized. To solve the above problem, the invention provides a high-powered microscope observation device comprising a predetermined pattern formed on a microscope sample holding member or stage, a recognition means for recognizing the predetermined pattern, and a moving means for moving the microscope sample holding member to a predetermined position on the basis of positional information recognized by the recognition means.
Inventors:
Katsumi Yoshino
Junya Kobayashi
Junya Kobayashi
Application Number:
JP2002375251A
Publication Date:
March 15, 2006
Filing Date:
December 25, 2002
Export Citation:
Assignee:
Japan Science and Technology Agency
Katsumi Yoshino
Junya Kobayashi
Katsumi Yoshino
Junya Kobayashi
International Classes:
G01B9/04; G01B11/00; G01N37/00; G01Q60/10; G01Q60/24; G02B21/00; G02B21/26; G02B21/34; G02B21/36
Domestic Patent References:
| JP4110810A | ||||
| JP9218932A | ||||
| JP2001166218A |
Attorney, Agent or Firm:
Ichiro Makino
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