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Title:
HIGH RESOLVING POWER MICROSCOPE AND PHASE RELAXING TIME MEASURING METHOD
Document Type and Number:
Japanese Patent JP2003121334
Kind Code:
A
Abstract:

To provide a high resolving power microscope capable of observing the non-linear optical response of a sample with high space resolving power and high time resolving power.

The high resolving power microscope is equipped with an incoherent beam source 1 for generating incoherent beam, a beam splitter 7 for splitting incoherent beam into two incoherent beams, a beam delay circuit 20 for temporally delaying one split incoherent beam A, a light path length control means 10 for cyclically changing the light path length of the other split incoherent beam B to control the delay time of the incoherent beam B, and an optical probe 30 irradiating the sample to be measured with incoherent superposed beam obtained by superposing the incoherent beams A and B one upon another through a near field.


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Inventors:
KOBAYASHI TAKAYOSHI
FUKUTAKE NAOKI
KOSAKA SHIGEHIRO
Application Number:
JP2001318121A
Publication Date:
April 23, 2003
Filing Date:
October 16, 2001
Export Citation:
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Assignee:
UNIV TOKYO
International Classes:
G01Q60/18; G01Q60/22; G02B26/06; G02F1/35; (IPC1-7): G01N13/14; G02B26/06; G02F1/35
Attorney, Agent or Firm:
Sugimura Kosaku (1 person outside)



 
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