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Patent Searching and Data


Title:
HIGH VOLTAGE TEST DEVICE
Document Type and Number:
Japanese Patent JP2012098174
Kind Code:
A
Abstract:

To perform, by a simple operation, a test of an entire cable without breaking a capacitor even if a coaxial cable incorporating the capacitor is tested.

The high voltage test device performs a test on an electric insulation state by applying a high voltage with a coaxial cable 11 defined as a testing object, the coaxial cable comprising a core wire 11a and an insulated shield conductor 11b. The high voltage test device includes a high voltage test fixture 20 for connecting two output electrodes 31 and 32, or outputs of a testing machine outputting the high voltage, to a central conductor and the shield conductor respectively of the coaxial cable of the test object. A cable connecting part includes a core wire short circuit part P1 for electrically short-circuiting between length-directional one end and the other end of the core wire 11a of the coaxial cable, and a shield line short circuit part P2 for electrically short-circuiting between length-directional one end and the other end of the shield conductor 11b of the coaxial cable.


Inventors:
OIWA KAZUYUKI
YAGI DAISUKE
Application Number:
JP2010246474A
Publication Date:
May 24, 2012
Filing Date:
November 02, 2010
Export Citation:
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Assignee:
YAZAKI CORP
International Classes:
G01R31/12; G01R31/00; H01B13/00
Domestic Patent References:
JP2009004147A2009-01-08
JP2000028674A2000-01-28
JPH01191073A1989-08-01
JPH09292435A1997-11-11
JPH11281685A1999-10-15
JP2003249318A2003-09-05
JP2003187926A2003-07-04
Attorney, Agent or Firm:
Hironori Honda
Toshimitsu Ichikawa