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Patent Searching and Data


Title:
HOLOGRAM ALIGNMENT MARK AND ITS MANUFACTURE
Document Type and Number:
Japanese Patent JP2000039516
Kind Code:
A
Abstract:

To obtain position alignment marks which do not deviate from the alignment mark positions of a hologram original plate by forming these marks of reflection type hologram having a prescribed shape.

The hologram 20 consists of a hologram layer 13, made of a photopolymer, etc., disposed on a glass substrate 12. Main holograms 21 consisting of a hologram array are recorded in approximately the central region of the hologram layer 13 and the central parts of their two sides are provided with the hologram alignment marks 22 in a prescribed positional relation with the main holograms 21. Both of the main holograms 21 and the hologram alignment marks 22 are formed of volume holograms of a phase type by the main holograms 21 consists of holograms of a transmission type and are usually transparent and invisible to eyes. The hologram alignment marks 22 are the reflection type holograms and consist of so-called hologram mirrors lined up with interference fringes in parallel with the hologram surface of the hologram layer 13. The external shapes (contours) of the reflection type holograms 22 are used as the alignment marks.


Inventors:
WATABE TAKECHIKA
Application Number:
JP20979798A
Publication Date:
February 08, 2000
Filing Date:
July 24, 1998
Export Citation:
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Assignee:
DAINIPPON PRINTING CO LTD
International Classes:
G02B5/20; G02B5/32; G03H1/20; (IPC1-7): G02B5/32; G02B5/20; G03H1/20
Attorney, Agent or Firm:
Hiroshi Nirazawa (7 outside)