Title:
How to change a fixed quantity of defects in a transparent substrate
Document Type and Number:
Japanese Patent JP6025265
Kind Code:
B2
Abstract:
Disclosed is a method for the detection and quantification of defects in transparent substrates and, more particularly, in glass sheets. The method comprises providing a transparent planar substrate having a top surface and a bottom surface. The surface topography of at least a portion of the top surface of the provide transparent planar substrate is measured to obtain a three dimensional top surface profile having a sub-nanometer level of precision. From the three dimensional surface profile measurement, the existence of one or more surface variations in the three dimensional surface profile having an amplitude greater than a predetermined tolerance can be identified and/or quantified.
Inventors:
Keith M Hill
Randy El MacLure
Richard Espritly
Randy El MacLure
Richard Espritly
Application Number:
JP2014095980A
Publication Date:
November 16, 2016
Filing Date:
May 07, 2014
Export Citation:
Assignee:
CORNING INCORPORATED
International Classes:
G01B11/30; G01N21/958
Domestic Patent References:
| JP9210657A | ||||
| JP8500898A |
Foreign References:
| US6909500 | ||||
| US20050088663 | ||||
| US5592402 | ||||
| WO2004079406A2 |
Attorney, Agent or Firm:
Yanagita Seiji
Go Sakuma
Go Sakuma
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