Title:
ユニットインターバルに含めるオーバーサンプルデータの決定方法
Document Type and Number:
Japanese Patent JP5344275
Kind Code:
B2
Abstract:
In some embodiments, a chip includes sampling circuitry to produce oversampled data from a received signal, and logic to determine which of the oversampled data are to be part of different unit intervals, wherein some of the unit intervals have a number of oversampled data that is different than a number of oversampled data typically included in the unit intervals. Other embodiments are described and claimed.
Inventors:
Choi Hoon
Application Number:
JP2007311577A
Publication Date:
November 20, 2013
Filing Date:
November 02, 2007
Export Citation:
Assignee:
Silicon Image, Incorporated
International Classes:
H04L25/08
Domestic Patent References:
| JP2003333110A | ||||
| JP2006203866A | ||||
| JP5028152U | ||||
| JP2004088386A | ||||
| JP2001111632A |
Foreign References:
| US20030115542 |
Attorney, Agent or Firm:
Sadao Kumakura
Fumiaki Otsuka
Takaki Nishijima
Hiroyuki Suda
Fumiaki Otsuka
Takaki Nishijima
Hiroyuki Suda