Title:
発光装置の作製方法
Document Type and Number:
Japanese Patent JP4818460
Kind Code:
B2
Abstract:
A method of manufacturing a light emitting device is provided in which satisfactory image display can be performed by the investigation and repair of short circuits in defect portions of light emitting elements. A backward direction electric current flows in the defect portions if a reverse bias voltage is applied to the light emitting elements having the defect portions. Emission of light which occurred from the backward direction electric current flow is measured by using an emission microscope, specifying the position of the defect portions, and short circuit locations can be repaired by irradiating a laser to the defect portions, turning them into insulators.
More Like This:
Inventors:
Hirokazu Yamagata
Adachi Yoshimi
Noriko Shibata
Adachi Yoshimi
Noriko Shibata
Application Number:
JP2010260833A
Publication Date:
November 16, 2011
Filing Date:
November 24, 2010
Export Citation:
Assignee:
Semiconductor Energy Laboratory Co., Ltd.
International Classes:
H05B33/10; G09F9/00; G09F9/30; H01L27/32; H01L51/50; H01L51/52; H05B33/12
Domestic Patent References:
| JP9266322A | ||||
| JP2000208252A | ||||
| JP2000196577A | ||||
| JP2000331782A | ||||
| JP2002189488A | ||||
| JP10321375A |