Title:
校正用三次元フィールド、校正用三次元フィールドの撮影方法
Document Type and Number:
Japanese Patent JP4598372
Kind Code:
B2
Abstract:
The field has two sets of rough alignment reference marks (112,122) for wide-angle and zooming. Two sets of precise alignment reference marks (114,124) are provided in the field for wide-angle and zooming. The rough and precise alignment reference marks (122,124) are arranged within a zooming area (120). The rough and precise alignment reference marks (112,114) are arranged within a wide-angle area (110). An independent claim is also included for a method of photographing with a camera for photographing a three-dimensional field for calibration.
Inventors:
Takayuki Noma
Tadayuki Ito
Hitoshi Otani
Mitsuharu Yamada
Nobuo Takachi
Tadayuki Ito
Hitoshi Otani
Mitsuharu Yamada
Nobuo Takachi
Application Number:
JP2003147209A
Publication Date:
December 15, 2010
Filing Date:
May 26, 2003
Export Citation:
Assignee:
Topcon Co., Ltd.
International Classes:
G01B11/00; G01C11/00; G01C25/00; G03B15/00; G06T1/00; H04N5/232
Domestic Patent References:
| JP1089957A | ||||
| JP6325154A | ||||
| JP6175715A | ||||
| JP9329418A | ||||
| JP886613A | ||||
| JP61277011A |
Attorney, Agent or Firm:
Sadaji Miyakawa
Kayoko Miyoko
Kayoko Miyoko