Title:
物体試験表面の完全開口数値データマップを合成する方法
Document Type and Number:
Japanese Patent JP4498672
Kind Code:
B2
Abstract:
A method for accurately synthesizing a full-aperture data map from a series of overlapped sub-aperture data maps. In addition to conventional alignment uncertainties, a generalized compensation framework corrects a variety of errors, including compensators that are independent in each sub-aperture. Another class of compensators (interlocked) include coefficients that are the same across all the sub-apertures. A constrained least-squares optimization routine maximizes data consistency in sub-aperture overlap regions. The stitching algorithm includes constraints representative of the accuracies of the hardware to ensure that the results are within meaningful bounds. The constraints also enable the computation of estimates of uncertainties in the final results. The method therefore automatically calibrates the system, provides a full-aperture surface map, and an estimate of residual uncertainties. Therefore, larger surfaces can be tested with greater departures from a best-fit sphere to greater accuracy than was possible in the prior art.
Inventors:
Donald Gorini
Greg Forbes
Paul Murphy
Greg Forbes
Paul Murphy
Application Number:
JP2002366136A
Publication Date:
July 07, 2010
Filing Date:
December 18, 2002
Export Citation:
Assignee:
QEE Technologies International Incorporated
International Classes:
G01B11/24; G01B9/02; G01B11/255; G01J9/00; G01M11/00; G01M11/02; G01N21/84
Domestic Patent References:
| JP2000088551A | ||||
| JP10332350A | ||||
| JP10281737A | ||||
| JP10160428A | ||||
| JP2000337862A |
Attorney, Agent or Firm:
Kazuo Shamoto
Shinjiro Ono
Yasushi Kobayashi
Akio Chiba
Hiroyuki Tomita
Shigeru Sakuma
Shinjiro Ono
Yasushi Kobayashi
Akio Chiba
Hiroyuki Tomita
Shigeru Sakuma