Title:
試験測定装置及び測定を提案するための試験測定装置をトレーニングする方法
Document Type and Number:
Japanese Patent JP7096653
Kind Code:
B2
Abstract:
An oscilloscope including an input port for receiving training data including waveforms and corresponding known classifications and a processor for training a plurality of classifiers on the training data. Training includes iteratively applying each classifier to each waveform of the training data to obtain corresponding predicted waveform classifications and comparing the predicted waveform classifications with the known classifications. Classifiers are corrected when predicted waveform classifications does not match the known classifications. Models for each classification are constructed with suggested measurements or actions. Subsequently, live waveform data is captured by the oscilloscope and the classifiers are applied to the live data. When a confidence value for a single classification exceeds a threshold, the waveform data is classified, and suggested measurements or actions are implemented in the oscilloscope based on the classification.
Inventors:
Ian Earl Abshire
Craig M. Strong
Craig M. Strong
Application Number:
JP2017173708A
Publication Date:
July 06, 2022
Filing Date:
September 11, 2017
Export Citation:
Assignee:
TEKTRONIX,INC.
International Classes:
G01R13/20; G01R31/28; G06N20/00; G06N20/20
Domestic Patent References:
| JP2002162419A | ||||
| JP2000314750A | ||||
| JP2000321307A | ||||
| JP2016050830A | ||||
| JP5126859A |
Foreign References:
| US20160125218 | ||||
| US20090281981 | ||||
| US20160341766 |
Attorney, Agent or Firm:
Hiroshi Arafune
Yoshio Arafune
Yamaguchi International Patent Office
Yoshio Arafune
Yamaguchi International Patent Office
Previous Patent: JP7096652
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