Title:
ICP emission spectrophotometer
Document Type and Number:
Japanese Patent JP6316064
Kind Code:
B2
More Like This:
| JP2856937 | [Title of Invention] Fine Particle Analyzer |
| JP2005106688 | LASER ABLATION SYSTEM AND LASER ABLATION METHOD |
| JPH07248296 | SAMPLE ATOMIZER FOR PLASMA ANALYZER |
Inventors:
Osamu Matsuzawa
Application Number:
JP2014072522A
Publication Date:
April 25, 2018
Filing Date:
March 31, 2014
Export Citation:
Assignee:
Hitachi High-Tech Science Co., Ltd.
International Classes:
G01N21/73
Domestic Patent References:
| JP2006275892A | ||||
| JP2011232106A | ||||
| JP2010501251A | ||||
| JP2008233248A | ||||
| JP2012507698A | ||||
| JP2008083035A | ||||
| JP2003344405A | ||||
| JP2006258633A | ||||
| JP2008510985A | ||||
| JP10300673A |
Foreign References:
| US5644396 | ||||
| US20140071448 | ||||
| US20050046825 |
Attorney, Agent or Firm:
Patent business corporation glory patent office
Yuriko Hamada
Kimihide Hashimoto
Yoshiaki Masaaki
Yuriko Hamada
Kimihide Hashimoto
Yoshiaki Masaaki