PURPOSE: To improve the quality of an obtained silicon oxide film and realize excellent film formation even when a silicon oxide film is further formed on the silicon oxide film through a TEOS-O3 process, for example, while an increase of the number of processing steps and addition/introduction of new facilities are suppressed.
CONSTITUTION: When a silicon oxide film is formed on a substrate 1 through a reaction of an organic silicon source and oxidizing agent, the silicon oxide film is formed within a chamber 10 where a high-frequency voltage is applied, and after stopping the application of high-frequency voltage, a gas containing an organic gas containing silicon is introduced into the chamber 10 successively, or a gas containing an alcohol is introduced thereinto.