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Title:
【発明の名称】製造プロセス品質異常処置システムおよび品質管理値更新方法
Document Type and Number:
Japanese Patent JP3355849
Kind Code:
B2
Abstract:
PURPOSE: To provide the manufacture process quality abnormality processing system and quality managing value updating method for the same with which measures can be previously taken for preventing trouble from being generated. CONSTITUTION: Respective process data collected by a process data collecter 12 are compared with a managing value, upper limit managing value and lower limit managing value decided from a product specification value by a collected data check device 14 and it is decided whether those data are settled within managing width or not. At the same time, an average value and dispersion are calculated by sampling, the tendency of these collected data is investigated, and the managing width is automatically reset to the serverer side by an automatic managing value updating device 15 corresponding to those calculated values. When the data exceed the managing width or get out of prescribed conditions, an alarm is issued or a lot is automatically stopped. Since the managing value is made sever corresponding to result data, quality is more improved. Besides, abnormality can be prevented from being generated by missing and any useless lot is not generated, either.

Inventors:
Yasunari Ito
Application Number:
JP2749595A
Publication Date:
December 09, 2002
Filing Date:
January 23, 1995
Export Citation:
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Assignee:
株式会社デンソー
International Classes:
B23Q41/08; B65G61/00; G05B19/418; G06Q50/00; G06Q50/04; H01L21/02; (IPC1-7): G05B19/418; B23Q41/08; H01L21/02
Domestic Patent References:
JP271961A
JP4354663A
JP5015985A
JP62264854A
JP6393548A
Attorney, Agent or Firm:
Osamu Fujitani