Title:
【発明の名称】放射フラックスメータの感度測定方法、放射フラックスメータおよびその使用
Document Type and Number:
Japanese Patent JPH11509923
Kind Code:
A
Abstract:
A method for measuring the sensitivity of a radiation fluxmeter in relation to one or more target surfaces Sc is described. It involves causing (1001) a thermal energy exchange between the radiation fluxmeter and the surrounding medium, and measuring, after the exchange step (1002), the temperature changes DELTA Tm of the radiation fluxmeter measurement surface and the changes in the voltage DELTA Vm delivered by said fluxmeter. The sensitivity Smc of the radiation fluxmeter is established (1003) as the ratio of the change in the voltage delivered by the fluxmeter to the change DELTA Tm in the measurement surface temperature. The invention is useful for making heat sensors and detectors for physical phenomena modifying the sensitivity of said sensors.
Inventors:
Gavio, Etienne
Godu, Pascal Veronique
Leclerc, Didier Lou
Terry, pierre
Godu, Pascal Veronique
Leclerc, Didier Lou
Terry, pierre
Application Number:
JP53307396A
Publication Date:
August 31, 1999
Filing Date:
April 30, 1996
Export Citation:
Assignee:
Université des Jeans et technology durill
International Classes:
G01K7/02; G01J5/10; G01J5/12; G01K15/00; H01L35/08; (IPC1-7): G01K15/00; G01J5/10; G01K7/02
Attorney, Agent or Firm:
Masatake Shiga (1 person outside)