Title:
【発明の名称】ファブリー・ペロ分光分析のための方法および装置
Document Type and Number:
Japanese Patent JPH05500562
Kind Code:
A
Abstract:
PCT No. PCT/DE90/00747 Sec. 371 Date Mar. 10, 1992 Sec. 102(e) Date Mar. 10, 1992 PCT Filed Oct. 1, 1990 PCT Pub. No. WO91/05988 PCT Pub. Date May 2, 1991.The invention relates to a process for Fabry-Perot spectroscopy using a spectrometer in the radiation path of which there is a radiation source, two successive Fabry-Perot interference filters through which the radiation passes, a blend of substances to be examined and a detector. The optical layer thickness of the first Fabry-Perot filter F1 is set to a given value and the optical layer thickness of the second Fabry-Perot filter F2 is modulated. The resultant interferogram as a function of the layer thickness is characteristic of the substance to be examined. The interferogram received at the detector D is converted by a mathematically transformation into a spectrum as a function of wave numbers.
Inventors:
Zechbauer, Michael
Application Number:
JP51283290A
Publication Date:
February 04, 1993
Filing Date:
October 01, 1990
Export Citation:
Assignee:
Hartmann und brown actien Gezershyaft
International Classes:
G01J3/26; G01J3/45; G01J3/12; (IPC1-7): G01J3/26; G01J3/45
Attorney, Agent or Firm:
Toshio Yano (2 outside)