Title:
【発明の名称】非接触ならい方法
Document Type and Number:
Japanese Patent JP2542631
Kind Code:
B2
Abstract:
A non-contact type probe (PRB) capable of measuring simultaneously distances to three points on a model surface is used to determine inclination increments in the X and Y directions from the distances of the points A, B and C with respect to the probe that are measured at each predetermined sampling time, and calculate the normal direction N of the model at the measuring point A. An increment of each axis per sampling time is determined from the increment of each of the three axes of rotation of the orthogonal coordinates system and the two axes of rotation of the probe necessary for turning the optical axis (OPI) to the normal direction while the measuring point A is kept fixed. The increment is also determined using a feed quantity per each sampling time and the distances measured by distance measuring means. While the optical axis (OPI) is directed to the model normal direction by performing simultaneous 5-axis control using these increments, the model (MDL) is profiled.
Inventors:
MATSURA HITOSHI
Application Number:
JP21974687A
Publication Date:
October 09, 1996
Filing Date:
September 02, 1987
Export Citation:
Assignee:
FANUC LTD
International Classes:
B23Q35/128; B23Q35/127; (IPC1-7): B23Q35/128
Domestic Patent References:
JP61274852A | ||||
JP6215063A |
Attorney, Agent or Firm:
Chika Saito