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Title:
DEVICE AND METHOD FOR PLASMA TREATMENT USED FOR PLASMA TREATING SEMICONDUCTOR WAFER OR THE LIKE
Document Type and Number:
Japanese Patent JPH0794451
Kind Code:
A
Abstract:

PURPOSE: To provide a plasma treating device which can freely control the distribution of plasma treating speed against an objected to be treated, can be improved in uniformity of the treating speed, and can be used for the plasma treatment of semiconductor wafers, etc.

CONSTITUTION: An electron beam 29 is taken out from electron-source plasma, accelerated, and introduced to a reaction chamber 4 and a gas required for plasma-treating an object 15 to be treated set in the chamber 4 is supplied to the chamber 4. Since at least a pair of magnets are opposed to each other across the passage of the electron beam 29 in the chamber 4, the beam 29 is deformed to a sheet-like shape by the magnetic field formed by the magnets and sheet-like plasma is generated by exciting the gas supplied to the chamber 4 with the beam 29. The magnets are positioned so that the treating speed of the object 15 can be made uniform.


Inventors:
ITO MASAO
Application Number:
JP8034494A
Publication Date:
April 07, 1995
Filing Date:
April 19, 1994
Export Citation:
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Assignee:
TOSHIBA CORP
International Classes:
H05H1/46; C23C16/50; H01J37/32; H01L21/205; H01L21/302; H01L21/31; (IPC1-7): H01L21/302; H01L21/205; H01L21/31; H05H1/46
Attorney, Agent or Firm:
Takehiko Suzue