Title:
【発明の名称】機械試験用試験片の変形を測定するための装置および方法
Document Type and Number:
Japanese Patent JP2001511511
Kind Code:
A
Abstract:
A device for measuring the deformation of a mechanical test specimen, and including a pressing member (3) for stressing a substantially flat specimen (16) in controlled manner by means of a punch (25); a Michelson interferometer having an optical branch (9d) defined optically by a first face (16b) of the specimen (16), and for generating interference images related to the deformation of the specimen (16); a telecamera (44) for acquiring and digitizing the interference images; and a processor (27) for processing the digitized images and controlling the measuring process fully automatically. The interferometer (9) may alternatively perform white light interferometry measurements, ESPI measurements, or ESPI profilometry measurements, by simply substituting the light source and control software.
Inventors:
Wellin, Maurice
Lucia, Alfredo Carlo
Lucia, Alfredo Carlo
Application Number:
JP2000504415A
Publication Date:
August 14, 2001
Filing Date:
July 20, 1998
Export Citation:
Assignee:
European Atomic Energy Community (Yoratom)
International Classes:
G01B9/02; G01B11/16; G01N3/06; G01N3/28; G01N3/02; G01N3/04; (IPC1-7): G01B11/16; G01N3/06; G01N3/28
Attorney, Agent or Firm:
Takashi Ishida (4 others)