Title:
【発明の名称】高い位置に配置されたサンプル表面を有するチップ
Document Type and Number:
Japanese Patent JP2003524193
Kind Code:
A
Abstract:
A test device is disclosed having a base (22) that is a non-sample surface and sample structures (25 (a,b)) comprising pillars (20 (a,b)), wherein each pillar comprises a sample surface (24 (a,b)) and side surfaces (18 (a,b)), and wherein the sample surface (24 (a,b,)) of each pillar and the surface of the substrate (23) have the same coating.
Inventors:
Indermuhl Pierre F
Elephant frank gee
Wagner Peter
Knock stefan
Elephant frank gee
Wagner Peter
Knock stefan
Application Number:
JP2001562662A
Publication Date:
August 12, 2003
Filing Date:
February 23, 2001
Export Citation:
Assignee:
The Iomix Incorporated
International Classes:
B01J19/00; B01L3/00; B01L3/02; B01L99/00; G01N33/53; G01N35/04; G01N35/10; G01N37/00; B81B1/00; C40B40/10; C40B60/14; (IPC1-7): G01N33/53; G01N35/04; G01N35/10; G01N37/00
Attorney, Agent or Firm:
Minoru Nakamura (9 outside)