Title:
【発明の名称】測定試験器の回転式試験ヘッドに設けられたプローブの直径調節装置
Document Type and Number:
Japanese Patent JP2777971
Kind Code:
B2
Abstract:
A method and apparatus for testing an elongate product for faults and defects, which comprises a rotatable testing head which permits the elongate product to be passed coaxially therethrough and which mounts a pair of testing probes so as to permit adjustment of their operating diameter. In order to automatically adjust the positions of the probes to accommodate elongate products of different sizes, there is provided an external adjustment unit, which stops the testing head in a predetermined angular position. The adjustment unit contains an external adjustment drive and when the rotation of the testing head has stopped, the external adjustment drive is advanced into operative engagement with the adjustable mounting of the testing probes. A measuring pin is also advanced into contact with the mounting of the testing probes so as to monitor the exact position of the probes, and during the repositioning of the probes a signal from the measuring pin is fed back to a control device to assure the precise positioning of the probes.
Inventors:
PEETAA HEBAARAIN
HANSU RINKU
HANSU RINKU
Application Number:
JP7634094A
Publication Date:
July 23, 1998
Filing Date:
March 24, 1994
Export Citation:
Assignee:
INSUCHI* DOKUTORU FURIIDORITSUHI FUERUSUTERU BURYUFUGEREETEBAU
International Classes:
G01N27/83; G01B7/00; G01B7/30; G01N27/90; (IPC1-7): G01N27/83
Domestic Patent References:
| JP5871452A | ||||
| JP1162146A | ||||
| JP6219754A | ||||
| JP61127454U | ||||
| JP6346844Y2 | ||||
| JP6346845Y2 |
Other References:
【文献】米国特許4053827(US,A)
【文献】米国特許3757208(US,A)
【文献】米国特許3757208(US,A)
Attorney, Agent or Firm:
Toru Tanabe