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Patent Searching and Data


Title:
IC CARD TEST SYSTEM
Document Type and Number:
Japanese Patent JPS6324486
Kind Code:
A
Abstract:

PURPOSE: To prevent the malfunction of the damage of an IC card by providing a small hole for detecting a position in the IC card.

CONSTITUTION: The IC card 1 has an electrode terminal 3 at one side and small holes 2 for detecting a position at both corners at the other side. When the IC card 1 is inserted into a connector part 16, a signal is fed to a control circuit 15 from a computer terminal equipment 17, thereby, converged light is projected to the small holes 2 respectively of the IC card 6 by a two lens having light emitting diode 12 through a light emitting diode driving circuit 11. The light passing through the two small holes 2 is received by respective phototransistors 13. The signal of the quantity of the received light from the two light receiving phototransistors 13 is transferred in a light receiving signal transfer circuit 14 and the control circuit 15 decides whether the inserted state of the IC card 1 to the connector part 16 is normal or abnormal according to the transfer signal.


Inventors:
FURUTA HIROSHI
Application Number:
JP16912086A
Publication Date:
February 01, 1988
Filing Date:
July 17, 1986
Export Citation:
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Assignee:
NEC CORP
International Classes:
G06K17/00; G06K13/06; (IPC1-7): G06K13/06; G06K17/00
Attorney, Agent or Firm:
Uchihara Shin