PURPOSE: To efficiently shorten a production period by disposing an electrodeless ultraviolet ray source in the IC supply part or the storing part of a handling device, irradiating the ultraviolet ray on a single IC chip and erasing the contents of a recording.
CONSTITUTION: The handling device 1 consists of the IC supply part 2, an IC carrying part 3, an IC measuring part 4, the IC storing part 5 ad a system control part 7. Ultraviolet ray erasing units 61, 62 including the electrodeless ultraviolet ray source 601 for generating the ultraviolet ray, a light screening shutter 603 and a reflector 602 are respectively disposed in the supply part 2 and the storing part 5. The unit 61, when the respective IC chips in IC supply lanes 21W26 are moved, irradiates the ultraviolet ray on the chip for a prescribed time through the shutter. In the unit 62 of the storing part 5, the ultraviolet ray is projected to the IC chips on storing lanes 51W56 to erase recorded data. Thereby, the production period can be efficiently shortened.
JPH06150678 | NONVOLATILE SEMICONDUCTOR MEMORY DEVICE |
JPH06324954 | EEPROM CHECK METHOD |
JPS58152000A | 1983-09-09 | |||
JPS6080234A | 1985-05-08 |