To provide an IC testing device capable of measuring by designating a plurality of pins together, without concerning that the number of pins used at the same time is limited and of referring a measured value of an arbitrary pin after the measurement.

Measurement of pins of which number exceeds the total number of pins which can be used in all of the DC current measuring sections at the same time is designated by a device program in a device program memory section 8. A control section 7 divides designated pins into measuring pin groups of which number of pins is not greater than the total number thereof and sets the pin number of an IC 1 that each of DC current measuring sections measures to each of measuring pin display register. Each of the DC current measuring sections notifies the control section 7 of the completion of the measuring when the measuring is completed. The control section 7 calculates a storing position of a measured value storing section 9 corresponding to the pin number in the measuring pin display register of the measuring section and stores the measured value read from each A/D converter to the position. After that, the control section 7 reads the measured value corresponding to the pin number designated by the device program from the measured value storing section 9.