IMAGE DISTORTION MEASURING PHANTOM

Japanese Patent JPS63222210

A

PURPOSE:To measure image distortion with high accuracy, by arranging spherical distortion measuring members having high radiation absorptivity and a small diameter to the surface or interior of a plate-shaped support member, which has low radiation absorptivity and high rigidity, in a lattice pattern. CONSTITUTION:A rectangular support member 7 is formed of a material having low radiation absorptivity and high rigidity, for example, a synthetic resin or an acrylic resin. A large number of distortion measuring members 8 are arranged to the surface of interior of the support member 7 in a lattice pattern so that an adjacent interval (d) is provided by required quantity to form an image distortion measuring phantom 6. Each of the distortion measuring members 8 is formed of a material having high radiation absorptivity, for example, a small steel sphere. The diameter of the small sphere is set to about 0.1-5mm and the interval (d) is set to about 5-50mm. Points A'-D' where an image is formed in a distorted state are detected by an image intensifier using the phantom 6 as an object to irradiate the same with radioactive rays from a radiation source and converting said rays to visible light to be compared with points A-D where an image is supposed to be originally formed and image distortions P1-P4 are measured. By this method, image distortion is measured with high accuracy.

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HAMAYA KAZUHIKO

JP5408987A

September 16, 1988

March 11, 1987

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HITACHI MEDICAL CORP

A61B6/00; G01N11/00; G01N23/04; G03B42/02; G01B15/00; (IPC1-7): A61B6/00; G01B15/00; G01N11/00; G01N23/04; G03B42/02

Nishiyama Haruyuki

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