Title:
IMAGE INSPECTION DEVICE, ADJUSTING DEVICE, AND METHOD FOR ADJUSTMENT
Document Type and Number:
Japanese Patent JP2021043159
Kind Code:
A
Abstract:
To provide an image inspection device that can allow a plurality of light sources to emit light at desired timings.SOLUTION: A timing setting unit of an image inspection device 100 detects the difference between a response time of a first light source 131 and a response time of a second light source 132 (the difference in the length of time) by the length of a sample defect in an image. The timing setting unit also sets a timing of outputting a first light emission control signal to the first light source 131 by a light emission control unit and a timing of outputting a second light emission control signal to a second light source 132 by the light emission control unit so that the first light source 131 and the second light source 132 will emit pulse light at the same time on the basis of the detected difference. In that way, it becomes possible to allow light emission timings of the first light source 131 and the second light source 132 to be matched.SELECTED DRAWING: Figure 1
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Inventors:
ISOZAKI HISASHI
OKAZAKI TOMOHIKO
SATO TAKUJI
SHIDA YUTAKA
OKAZAKI TOMOHIKO
SATO TAKUJI
SHIDA YUTAKA
Application Number:
JP2019167445A
Publication Date:
March 18, 2021
Filing Date:
September 13, 2019
Export Citation:
Assignee:
TAKANO CO LTD
International Classes:
G01N21/88
Domestic Patent References:
| JP2013108775A | 2013-06-06 | |||
| JP2000343256A | 2000-12-12 |
Attorney, Agent or Firm:
Kimura Mitsuru
Kazuyuki Sugimoto
Yasushi Sakakibara
Taiji Morikawa
Kazuyuki Sugimoto
Yasushi Sakakibara
Taiji Morikawa