Title:
画像検査装置、画像検査システム及び画像検査方法
Document Type and Number:
Japanese Patent JP6954008
Kind Code:
B2
Abstract:
An image inspection device includes a reading device and a processor. The reading device is configured to read a chart image on a recording medium to generate a first read image. The reading device is configured to read an image to be inspected on a recording medium to generate a second read image. The processor is configured to calculate a plurality of types of correction parameters on basis of the first read image and image data of the chart image, correct the image data with the plurality of types of correction parameters to generate a reference image, and compare the reference image and the second read image to inspect the second read image.
Inventors:
Fukase Takahiro
Application Number:
JP2017212261A
Publication Date:
October 27, 2021
Filing Date:
November 01, 2017
Export Citation:
Assignee:
株式会社リコー
International Classes:
B41F33/00; H04N1/00; G01J3/52; G01N21/892; G06T7/00
Domestic Patent References:
JP2009126058A | ||||
JP2010042634A | ||||
JP2005223515A | ||||
JP2013123812A |
Foreign References:
US20130148987 |
Attorney, Agent or Firm:
Tadashige Ito
Tadahiko Ito
Tadahiko Ito