Title:
IMAGING APPARATUS, MEASURING DEVICE, AND MEASURING METHOD
Document Type and Number:
Japanese Patent JP2021018079
Kind Code:
A
Abstract:
To make it possible to perform three-dimensional measurement of an object accurately in a short time.SOLUTION: An imaging apparatus has a filter unit that includes a plurality of filter piece parts transmitting light with different wavelengths, and a plurality of light receiving elements that each receive the light with respective wavelengths passing through the filter piece parts and each output a light receiving signal according to information on the received light, and the imaging apparatus is used to irradiate an object, as one or more groups, with light with a plurality of different wavelengths of a predetermined projection pattern, and measure depth information on the object based on the light receiving signals from the imaging apparatus. Thus, independent light receiving signals in a number of times of projection according to the respective wavelengths can be obtained in "single photography" without being affected by disturbance light and light with the other wavelengths. Consequently, the light receiving signals with the respective wavelengths can be analyzed to achieve accurate measurement of the object. Also, the number of times of photography can be reduced, and the entire measurement time can be largely reduced.SELECTED DRAWING: Figure 17
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Inventors:
YONEDA KAZUHIRO
MIKI YOSHIHIKO
FUKUOKA NAOKI
MIKI YOSHIHIKO
FUKUOKA NAOKI
Application Number:
JP2019132203A
Publication Date:
February 15, 2021
Filing Date:
July 17, 2019
Export Citation:
Assignee:
RICOH CO LTD
International Classes:
G01B11/24; H04N5/225; H04N9/07
Domestic Patent References:
| JP2016170122A | 2016-09-23 |
Attorney, Agent or Firm:
Hiroaki Sakai