Title:
撮像装置
Document Type and Number:
Japanese Patent JP7273611
Kind Code:
B2
Abstract:
To provide an imaging method that achieves both high resolution and wide viewing, and an imaging device with a simplified device structure.SOLUTION: An imaging method for an observation object 30 disposed between a light-emitting surface 11a and a light-receiving surface 12a is disclosed. The light-emitting surface 11a, the light-receiving surface 12a, and the observation object 30 are shielded from external light. The light-emitting surface 11a includes a plurality of light-emitting regions 21 arranged in matrix. The observation object 30 is imaged in a manner that the plurality of light-emitting regions 21 emit light sequentially and in synchronization with the light emission of the light-emitting region 21, the data corresponding to the quantity of light received in the light-receiving surface 12a is acquired sequentially.SELECTED DRAWING: Figure 1
Inventors:
Takayuki Ikeda
Yusuke Negoro
Kobayashi Hidetomo
Nagaaki Shishido
Toshio Ikeda
Yusuke Negoro
Kobayashi Hidetomo
Nagaaki Shishido
Toshio Ikeda
Application Number:
JP2019089145A
Publication Date:
May 15, 2023
Filing Date:
May 09, 2019
Export Citation:
Assignee:
Semiconductor Energy Laboratory Co., Ltd.
International Classes:
G02B21/36; G01N21/17; G02B21/06; G02B21/24
Domestic Patent References:
| JP4505061A | ||||
| JP2015084059A | ||||
| JP5323197A |