Title:
ｉｎ ｖｉｖｏ全視野干渉顕微鏡を用いたイメージング方法およびシステム
Document Type and Number:
Japanese Patent JP7394126
Kind Code:
B2
Abstract:
According to one aspect, the invention relates to a system (101) for in vivo, full-field interference microscopy imaging of a scattering three-dimensional sample. It comprises a full-field OCT imaging system (130) for providingen faceimages of the sample, wherein said full-field OCT system comprises an interference device (145) with an object arm (147) intended to receive the sample and a reference arm (146) comprising an optical lens (134) and a first reflection surface (133), and an acquisition device (138) configured to acquire a temporal succession of two-dimensional interferometric signals (I1, I2) resulting from interferences produced at each point of an imaging field; an OCT imaging system (110) for providing at the same times of acquisition of said two-dimensional interferometric signals, cross-sectional images of both the sample and a first reflection surface (133) of said full-field OCT imaging system (130); a processing unit (160) configured to determine a plurality ofen faceimages (X - Y) of a plurality of slices of the sample, eachen faceimage being determined from at least two two-dimensional interferometric signals (I1, I2) having a given phase shift; determine from the cross-sectional images provided by the OCT imaging system (110) at the times of acquisition of each of said two two-dimensional interferometric signals (I1, I2) a depth (z) for eachen faceimage (X - Y) of said plurality of slices; determine a 3D image of the sample from said plurality ofen faceimages of said plurality of slices of the sample and depths.
Inventors:
Mazuran, Viacheslav
Xiao pen
Fink, Matthias
Boccara, Albert Claude
Xiao pen
Fink, Matthias
Boccara, Albert Claude
Application Number:
JP2021517572A
Publication Date:
December 07, 2023
Filing Date:
September 27, 2019
Export Citation:
Assignee:
PARIS SCIENCES ET LETTRES
Center National de la Cherche Sian Tiffic
Ecole Superior de Fijique E de Simian de Sturier de la Ville de Paris
Center National de la Cherche Sian Tiffic
Ecole Superior de Fijique E de Simian de Sturier de la Ville de Paris
International Classes:
A61B3/10; A61B3/13; G01N21/17; G02B21/00
Domestic Patent References:
| JP2018517149A |
Foreign References:
| US20130182096 |
Other References:
Viacheslav Mazlin,Ultra-High Resolution Full-Field OCT(FFOCT) for Cornea and Retina,Imaging and Applied Optics,IM3B.1,米国,2018年
Attorney, Agent or Firm:
Shinichiro Tanaka
▲吉▼田 和彦
Hiroyuki Suda
Fumiaki Otsuka
Takayoshi Nishijima
Hiroshi Uesugi
Naoki Kondo
Takeo Nasu
▲吉▼田 和彦
Hiroyuki Suda
Fumiaki Otsuka
Takayoshi Nishijima
Hiroshi Uesugi
Naoki Kondo
Takeo Nasu