Title:
インピーダンス測定システムおよびインピーダンス測定方法
Document Type and Number:
Japanese Patent JP6943727
Kind Code:
B2
Abstract:
To provide a system and a method for measuring impedance, which reduces a measurement error due to an influence of voltages induced among impedance measurement devices, and the like, when measuring the impedance of a measurement sample using multiple impedance measurement devices.SOLUTION: Constant power sources acting as measurement AC sources of multiple impedance measurement devices are synchronized to feed synchronized measurement AC currents to a measurement sample. Or, phases of measurement AC currents generated by adjacent impedance measurement devises are controlled to be in antiphase with each other before feeding the currents to a measurement sample to perform measurement.SELECTED DRAWING: Figure 1
Inventors:
Naoya Kitamura
Junji Iijima
Junji Iijima
Application Number:
JP2017216792A
Publication Date:
October 06, 2021
Filing Date:
November 09, 2017
Export Citation:
Assignee:
Hioki Electric Co., Ltd.
International Classes:
G01R27/02
Domestic Patent References:
| JP2003315394A | ||||
| JP2003139811A | ||||
| JP201758176A |
Foreign References:
| US20070164751 |
Attorney, Agent or Firm:
Iat International Patent Business Corporation