To provide an impedance parameter estimation device capable of rapidly and simply finding equivalent circuits and parameters of test impedance with high accuracy.
From a swept sine wave generator 14, a frequency- swept sine wave-like change is given to a current passing through test impedance 11. In this state, an impedance measurement part 17 finds impedance measurement values from measurement values of voltage detection part 15 and a current detection part 16 at respective frequencies. The impedance measurement values for the respective frequencies are given to an equivalent circuit estimation part 18. Simultaneous equations in the form of transfer functions are prepared and solutions of the equations are decomposed into a combination of linear and quadratic forms. Portions of the linear and quadratic forms obtained by the decomposition are converted into respectively corresponding equivalent circuits and parameters, thereby estimating the equivalent circuits and parameters of the test impedance 11.
Sadao Muramatsu
Atsushi Tsuboi
Ryo Hashimoto
Satoshi Kono
Makoto Nakamura