Title:
METHOD OF ETCHING SILICON OXIDE
Document Type and Number:
Japanese Patent JPH0786229
Kind Code:
A
Abstract:
PURPOSE: To form a clean through hole free from overhangs and a residue such as a by product in a multilayer silicon layer formed by silicon oxide layers of different composition.
CONSTITUTION: An oxidized by product 5 of directional etching existing on the side wall. and bottom of a through hole 4 is eliminated by treatment with buffered hydrofluoric acid (BHF) containing ammonium fluoride to form a clean through hole 6.
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Inventors:
KUNII YASUO
KATO SHINICHI
MAEDA MASAHIKO
KATO SHINICHI
MAEDA MASAHIKO
Application Number:
JP17592593A
Publication Date:
March 31, 1995
Filing Date:
June 24, 1993
Export Citation:
Assignee:
NIPPON TELEGRAPH & TELEPHONE
International Classes:
H01L21/28; H01L21/306; (IPC1-7): H01L21/306; H01L21/28
Attorney, Agent or Firm:
Masaki Yamakawa
Next Patent: METHOD OF TAPER ETCHING