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Patent Searching and Data


Title:
直接干渉電流および間接干渉電流の影響を軽減するための改善された電気化学検査ストリップ
Document Type and Number:
Japanese Patent JP2007514930
Kind Code:
A
Abstract:
The present invention is directed to a method of reducing the effects of interfering compounds in the measurement of analytes and more particularly to a method of reducing the effects of interfering compounds in a system wherein the test strip utilizes two or more working electrodes. In one embodiment of the present invention, a first potential is applied to a first working electrode and a second potential, having the same polarity but a greater magnitude than the first potential, is applied to a second working electrode.

Inventors:
Davis Oliver William Hardwicke
Marshall Robert
Buskey Field Damian Edward Haden
Wight lindsey
Raper Elaine
Application Number:
JP2006537434A
Publication Date:
June 07, 2007
Filing Date:
October 29, 2004
Export Citation:
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Assignee:
LifeScan Scotland, Ltd.
International Classes:
G01N27/327; A61B5/00; C12Q1/00; G01N27/26; G01N27/28; G01N27/403; G01N27/416; G01N27/49; G01N33/487; G06F19/00; A61B5/145
Attorney, Agent or Firm:
Hiroaki Tazawa
Konobu Kato
Hideaki Tazawa
Hamada Hatsune