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Title:
INFRARED DETECTION ELEMENT AND INFRARED DETECTION DEVICE
Document Type and Number:
Japanese Patent JP2009250818
Kind Code:
A
Abstract:

To provide an electron discharge infrared detection element and an infrared detection device having sensitivity in a wide wavelength region including a far infrared region.

The infrared detection element includes: a substrate; a temperature detection part including a semiconductor element; an infrared detection part held to be separated from the substrate through a support leg; and an electron discharge part for discharging electrons. A discharge amount of the electrons discharged from the electron discharge part changes in response to change of current voltage characteristics corresponding to temperature change of the semiconductor element.


Inventors:
TAKAMURO DAISUKE
Application Number:
JP2008100075A
Publication Date:
October 29, 2009
Filing Date:
April 08, 2008
Export Citation:
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Assignee:
MITSUBISHI ELECTRIC CORP
International Classes:
G01J1/02
Domestic Patent References:
JP2000111424A2000-04-21
JP2002340684A2002-11-27
JP2006019275A2006-01-19
JP2006126203A2006-05-18
JPH11287713A1999-10-19
Attorney, Agent or Firm:
Samejima Mutsumi
Kyousei Tamura
Keiichi



 
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