To provide an infrared detector generating no inclination in a detection part or the like by an internal stress, and also to provide an infrared solid imaging device including the same.
This substantially rectangular infrared detector for detecting a temperature change of the detection part by a detection film includes: a substrate; the detection part provided with the detection film; a support leg for supporting the detection part on the substrate; and a wiring layer provided in the support leg and connected to the detection film. The infrared detector has a structure to bring the support leg into a condition axisymmetric to a normal to a substrate surface, in an intersection of diagonal lines of the infrared detector. The infrared solid imaging device includes the infrared detectors arranged matrixlikely.
NAKAGI YOSHIYUKI
JP2000321125A | 2000-11-24 | |||
JP2003224260A | 2003-08-08 | |||
JPH08285680A | 1996-11-01 |
WO1999031471A1 | 1999-06-24 |
Takuji Yamada
Haruo Nakano