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Title:
INFRARED DETECTOR, AND INFRARED SOLID IMAGING DEVICE
Document Type and Number:
Japanese Patent JP2006300816
Kind Code:
A
Abstract:

To provide an infrared detector generating no inclination in a detection part or the like by an internal stress, and also to provide an infrared solid imaging device including the same.

This substantially rectangular infrared detector for detecting a temperature change of the detection part by a detection film includes: a substrate; the detection part provided with the detection film; a support leg for supporting the detection part on the substrate; and a wiring layer provided in the support leg and connected to the detection film. The infrared detector has a structure to bring the support leg into a condition axisymmetric to a normal to a substrate surface, in an intersection of diagonal lines of the infrared detector. The infrared solid imaging device includes the infrared detectors arranged matrixlikely.


Inventors:
OTA YASUAKI
NAKAGI YOSHIYUKI
Application Number:
JP2005124994A
Publication Date:
November 02, 2006
Filing Date:
April 22, 2005
Export Citation:
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Assignee:
MITSUBISHI ELECTRIC CORP
International Classes:
G01J1/02; H01L27/14; H01L31/02; H01L35/32; H01L37/00; H01L37/02; H01L37/04; H04N5/33
Domestic Patent References:
JP2000321125A2000-11-24
JP2003224260A2003-08-08
JPH08285680A1996-11-01
Foreign References:
WO1999031471A11999-06-24
Attorney, Agent or Firm:
Osamu Kawamiya
Takuji Yamada
Haruo Nakano