To enable determination of a defective pixel to be performed with higher precision in an infrared imaging apparatus.

A sensitivity correction standard 110 is designed to radiate three or more infrared rays each having uniform reference temperature, a multi pixel infrared detector 130 is designed to perform photoelectric conversion after detecting an infrared ray, and an sensitivity correction processing unit 140 is designed to perform sensitivity correction and the determination of the defective pixel using three or more electronic signals. A defective pixel substitution processing unit 150 is designed to substitute an output signal of a pixel existing near the defective pixel for an output signal from a pixel determined to be a defective pixel by the sensitivity correction processing unit 140.