Title:
INSPECTED RESULT OUTPUTTING METHOD FOR SUBSTRATE INSPECTING DEVICE
Document Type and Number:
Japanese Patent JP3189308
Kind Code:
B2
Abstract:
PURPOSE: To obtain an inspected result outputting method by which such a defective part as defective soldered part, etc., on a substrate can be accurately and quickly confirmed.
CONSTITUTION: The display screen 7 of a displaying section has a picture displaying section (c) and defective parts information displaying section (b). In the picture displaying section (c) pictures of the external sizes of a substrate and parts are displayed and, at the same time, vertical and horizontal dividing lines 34 and 35 for dividing a substrate area into a plurality of areas are graphically displayed in a grid. In the defective parts information displaying section (b) the name or number 40 of each defective parts and the address 41 of the area where the defective parts are mounted are displayed in lettering in a paired state.
Inventors:
Koichi Tanaka
Application Number:
JP20236591A
Publication Date:
July 16, 2001
Filing Date:
July 16, 1991
Export Citation:
Assignee:
Omron Corporation
International Classes:
G01N21/88; G01N21/93; G01N21/956; G06T1/00; G09G5/00; H05K3/34; (IPC1-7): G01N21/956; G06T1/00; H05K3/34
Domestic Patent References:
| JP344054A | ||||
| JP276080A | ||||
| JP58135941A |
Attorney, Agent or Firm:
Yoshimitsu Suzuki