Title:
INSPECTING APPARATUS OF SURFACE FLAW
Document Type and Number:
Japanese Patent JPH04169807
Kind Code:
A
Abstract:
PURPOSE:To improve the precision in determination of good and bad articles by providing a signal level threshold and an area threshold corresponding to the kind of a surface flaw of a test specimen and by determining the surface flaw on the basis of the two thresholds. CONSTITUTION:When it is assumed that there are a dint, a short transverse line flaw and a long transverse line flaw in the surface of a test specimen, a comparator 13a compares output signals 10 thereof with a threshold 11 and detects all the flaws, and a binary-coded image memory 14a stores binary-coded signals thereof. Meanwhile, a comparator 13b compares them with a threshold 12 and detects only a bruise flaw having a high peak value, and a memory 14b stores a binary-coded signal thereof. Area computing elements 15a and 15b compute the area of the flaw from these binary- coded signals and comparators 17a and 17b compare it with area thresholds 16a and 16b. For the threshold 16a, herein, a value smaller than an area S3 and larger than S4 is selected, while a value smaller than an area S2 is selected for the threshold 16b. As the result, the comparators 17a and 17b judge only the long transverse line flaw and the bruise flaw as flaws affecting the quality of a picture respectively, while they do not judge the short traverse line flaw as such a flaw as the above. Accordingly, the possibility of determining a good article as a bad one is reduced.
Inventors:
HIRONO AYUMI
YAMADA MAKI
YAMADA MAKI
Application Number:
JP29372490A
Publication Date:
June 17, 1992
Filing Date:
November 01, 1990
Export Citation:
Assignee:
FUJI XEROX CO LTD
International Classes:
G01B11/30; G01N21/88; (IPC1-7): G01B11/30; G01N21/88
Domestic Patent References:
| JPS62229050A | 1987-10-07 | |||
| JPS56160645A | 1981-12-10 |
Attorney, Agent or Firm:
Michito Hiraki (1 person outside)