Title:
INSPECTING METHOD AND INSPECTING DEVICE FOR ACTIVE MATRIX LIQUID CRYSTAL PANEL
Document Type and Number:
Japanese Patent JP3186360
Kind Code:
B2
Abstract:
PURPOSE: To simplify the inspecting method for an active matrix liquid crystal panel and to shorten the time thereof.
CONSTITUTION: The active matrix liquid crystal panel 4 to be inspected has a group of pixels 14 arranged in matrix, gate wires 15 connected to respective rows of the pixels 14 and data lines 16 connected to respective columns of the pixels 14. The gate lines 15 are first successively scanned and the respective rows of the pixels 14 are selected. Prescribed driving signals are supplied from the input terminal 17 side of the respective data lines 16 and all of the matrix of the pixels 14 are lighted to make display. The groups of the pixels 14 which are fully lighted to make display are subjected to image pickup and are recorded in a frame memory. The flickering states of the recorded pixels 14 are subjected to pixel analyses successively from the lowermost rows existing at the open end 18 of the data lines 16 toward the uppermost row existing on the input terminal 17 side. The flickering defects are generated from a disconnection point toward the lowermost row if there is a disconnection fault in mid-way of the data lines 16. Then, the line defect detection is rapidly discovered by first conducting the image analyses from the lowermost row.
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Inventors:
Haruhito Kusunoki
Haruhiko Kaneko
Haruhiko Kaneko
Application Number:
JP20586293A
Publication Date:
July 11, 2001
Filing Date:
July 27, 1993
Export Citation:
Assignee:
ソニー株式会社
International Classes:
G02F1/13; G01R31/00; G02F1/133; G02F1/136; G02F1/1368; (IPC1-7): G02F1/1368
Domestic Patent References:
| JP3209422A | ||||
| JP4133088A | ||||
| JP63136086A | ||||
| JP1189696A |
Attorney, Agent or Firm:
Harutoshi Suzuki