INSPECTION AND ANALYSIS DEVICE USING NEUTRON GENERATING DEVICE

Title:

INSPECTION AND ANALYSIS DEVICE USING NEUTRON GENERATING DEVICE

Document Type and Number:

Japanese Patent JP2003315289

Kind Code:

A

Abstract:

To provide a small-sized simple inspection and analysis device using neutrons.

This inspection and analysis device uses a neutron generating device characterized in having a neutron source which generates high-speed neutrons by using a nuclear fusion reaction, a neutron decelerating material which generates cold/heat neutrons by decelerating the neutrons generated from the neutron source, and a neutron reflecting device which reflects the cold/heat neutrons. This device also has a neutron guide pipe which guides the cold/heat neutrons from the neutron reflecting device, a neutron wavelength selecting device which selects a specific wavelength of the cold/heat neutrons, and a two-dimensional neutron detector which projects the neutrons having the selected specific wavelength upon a sample or material and detects neutrons transmitted through or scattered or reflected by the sample or material.

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Inventors:

TADOKORO TAKAHIRO
TAKEUCHI KAZUHIRO
UCHIKAWA SADAO
NIIMURA NOBUO

Application Number:

JP2002117166A

Publication Date:

November 06, 2003

Filing Date:

April 19, 2002

Export Citation:

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Assignee:

HITACHI LTD
JAPAN ATOMIC ENERGY RES INST

International Classes:

G01N23/20; G01N23/05; G01N23/221; G01T3/00; G01T3/08; G21K1/00; G21K1/06; G21K1/10; G21K5/02; G21K5/08; H05H3/06; (IPC1-7): G01N23/20; G01N23/05; G01N23/221; G01T3/00; G01T3/08; G21K1/00; G21K1/06; G21K1/10; G21K5/02; G21K5/08; H05H3/06

Attorney, Agent or Firm:

Katsuo Ogawa (1 person outside)

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