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Patent Searching and Data


Title:
INSPECTION OF BAKING ELECTRODE OF CHIP TYPE ELECTRONIC PART
Document Type and Number:
Japanese Patent JPH07270400
Kind Code:
A
Abstract:

PURPOSE: To mainly inspect the solderability of a baking electrode simply and accurately within a relatively short time and to support the accurate preparation of conductive paste good in electrode characteristics.

CONSTITUTION: In the inspection of the soldering aptitude of the baking electrodes 12, 12 of a chip type electronic part 10 produced by coating the terminal part of a bare chip 11 with a conductive paste composed of a mixture of a metal powder containing Ag, glass fine particles and an org. vehicle and baking the coated part, the chip type electronic part 10 is allowed to stand in gas containing a predetermined amt. of a sulfur component for a predetermined time and the baking electrodes 12, 12 are optically observed. The surface hue of the electrodes changes corresponding to the exposure degree of the Ag component.


Inventors:
KOMATSU RYUICHI
SUGIHARA TADASHI
Application Number:
JP5843694A
Publication Date:
October 20, 1995
Filing Date:
March 29, 1994
Export Citation:
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Assignee:
MITSUBISHI MATERIALS CORP
International Classes:
G01N33/20; H01B1/16; H01G4/12; H01G4/252; H01G13/00; (IPC1-7): G01N33/20; H01B1/16; H01G4/12; H01G4/252; H01G13/00
Attorney, Agent or Firm:
Masayoshi Suda