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Title:
INSPECTION CONTACT PIECE AND INSPECTION JIG
Document Type and Number:
Japanese Patent JP2013024716
Kind Code:
A
Abstract:

To provide a fine contact piece and a fine inspection jig capable of coping with refinement and complication of a substrate, providing strong pressing force in an inspection, and providing weak pressing force in a non-inspection.

An inspection jig electrically connects an inspection object having a plurality of inspection points with an inspection device which inspects electric characteristics, includes: an electrode body having a plurality of electrode parts which are connected with the inspection device; and an inspection contact piece which connects the electrode parts with the inspection points. The inspection contact piece includes: a conductive cylindrical member which has openings on both ends, of which the tip opening contacts the surface of the electrode parts; a conductive bar-like member which is projected from the rear end opening of the cylindrical member, arranged inside the cylindrical member, and of which the tip contacts the inspection points; and a fixation part which electrically connects the cylindrical member with the bar-like member. The cylindrical member has a first notch, and a second notch in which a spiral notch which expands and contracts in the long axis direction is formed at a wall part of the cylindrical member, and either of the first notch or the second notch reaches a limit of contraction when the bar-like member contacts inspection points and an inspection is executed.


Inventors:
NUMATA KIYOSHI
Application Number:
JP2011159519A
Publication Date:
February 04, 2013
Filing Date:
July 21, 2011
Export Citation:
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Assignee:
NIDEC READ CORP
International Classes:
G01R1/073; G01R1/067; G01R31/26; H01L21/66
Domestic Patent References:
JP2010281592A2010-12-16
JP2006098254A2006-04-13
JP4572303B12010-11-04
JP2011089801A2011-05-06
Foreign References:
US20070270041A12007-11-22
US20120001650A12012-01-05
Attorney, Agent or Firm:
Hideaki Kitamura