Title:
検査装置、データ生成装置、データ生成方法及びデータ生成プログラム
Document Type and Number:
Japanese Patent JP6936957
Kind Code:
B2
Abstract:
Provided is an inspection apparatus, a data generation apparatus, and the like for generating learning data with which the identification accuracy of an identification device can be improved such that whether or not an object to be inspected includes a defect can be identified with high accuracy. An inspection apparatus includes: an image capturing apparatus configured to capture an image of an object to be inspected: a determination unit configured to determine, based on the image, whether or not the object to be inspected includes a defect, using an identification device that has been trained using learning data: an input unit configured to accept an input indicating whether or not a determination result by the determination unit is correct; an extraction unit configured to extract a partial image of the image based on which the determination has been made; and a generation unit configured to generate new learning data based on the partial image, if a fact that the determination result by the determination unit is not correct has been input.
Inventors:
Hanzawa Yuki
Kurita Shinji
Kurita Shinji
Application Number:
JP2017214945A
Publication Date:
September 22, 2021
Filing Date:
November 07, 2017
Export Citation:
Assignee:
OMRON Corporation
International Classes:
G06T7/00; G01N21/88
Domestic Patent References:
| JP2017151813A | ||||
| JP2003100826A |
Attorney, Agent or Firm:
Yoshiyuki Inaba
Toshifumi Onuki
Akihiko Eguchi
Kazuhiko Naito
Kentaro Ito
Toshifumi Onuki
Akihiko Eguchi
Kazuhiko Naito
Kentaro Ito