Title:
検査装置及び検査用学習モデル生成装置
Document Type and Number:
Japanese Patent JP7283096
Kind Code:
B2
Abstract:
An inspection device includes a first data storage unit configured to store a first data which is time series according to a state of an inspection object, a second data generation unit configured to generate second data, which is a spectrogram including a first frequency component, a time component, and an amplitude component by performing short-time Fourier transform on the first data, a third data generation unit configured to generate third data including the first frequency component, a second frequency component, and the amplitude component by performing Fourier transform on time-amplitude data for each first frequency component in the second data, respectively, and a determination unit configured to determine the state of the inspection object based on the third data.
Inventors:
Masaaki Kano
Application Number:
JP2019018311A
Publication Date:
May 30, 2023
Filing Date:
February 04, 2019
Export Citation:
Assignee:
JTEKT Corporation
International Classes:
G01M99/00; B62D5/04; G01H1/00; G01H3/04
Domestic Patent References:
| JP11108806A | ||||
| JP2018049355A | ||||
| JP2018147172A | ||||
| JP2017122665A | ||||
| JP2018036269A | ||||
| JP11212637A | ||||
| JP59109831A |
Foreign References:
| WO2018168873A1 | ||||
| WO2018150616A1 | ||||
| US20170241422 | ||||
| CN108205016A |
Attorney, Agent or Firm:
Patent Attorney Corporation Aichi International Patent Office
Patent Attorney Corporation Kyoritsu Patent Office
Patent Attorney Corporation Kyoritsu Patent Office
Previous Patent: Control device, control method and program
Next Patent: PROCESSING METHOD AND PROCESSING SYSTEM
Next Patent: PROCESSING METHOD AND PROCESSING SYSTEM