Title:
INSPECTION DEVICE, INSPECTION METHOD, AND INSPECTION PROGRAM
Document Type and Number:
Japanese Patent JP2015105889
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide an inspection device, an inspection method, and an inspection program which are capable of mixing two kinds of liquid evenly.SOLUTION: The inspection device rotates an inspection chip provided with a mixing part in which a sample and a reagent are mixed, causing a centrifugal force generated by rotation to act on the sample and the reagent, thereby having the sample and the reagent mixed in the mixing part. A CPU of the inspection device rotates the inspection chip at a revolution speed Vc (S75). The CPU, after rotating the inspection chip at the revolution speed Vc by an S75 process, stops the rotation of the inspection chip in the revolving direction (S77). The CPU, after stopping the rotation of the inspection chip by an S77 process, rotates the inspection chip at a revolution speed Ve (S79). The CPU, after rotating the inspection chip at the revolution speed Ve by an S79 process, stops the rotation of the inspection chip in the revolving direction (S81).
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Inventors:
OSHIKA YUMIKO
YOSHIMURA CHISATO
YOSHIMURA CHISATO
Application Number:
JP2013248594A
Publication Date:
June 08, 2015
Filing Date:
November 29, 2013
Export Citation:
Assignee:
BROTHER IND LTD
International Classes:
G01N35/00; G01N35/08
Domestic Patent References:
| JP2009264858A | 2009-11-12 | |||
| JP2007232673A | 2007-09-13 | |||
| JP2009156765A | 2009-07-16 |
Attorney, Agent or Firm:
Hisashi Yamamoto
Tomohiro Inayama
Tomohiro Inayama
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