To inspect whether a sampling device correctly averages samples based on a specified average number of samples.
An inspection device that inspects a sampling device that averages values of measured signals with respect to each trigger signal for a specified averaging period of time and outputs them, and the inspection device is equipped with: a signal supply unit that supplies to the sampling device a first signal which monotonously increases or decreases and supplies to the sample device a second signal which monotonously increases or decreases according to the curve of different type from that of the first signal; a trigger supply unit that supplies to the sampling device a trigger signal in each of a predetermined timing of the first signal and a predetermined timing of the second signal; and a determination unit that determines whether the number of samples in which the sampling device averages the measured signals, the number of samples corresponding to the averaging period of time, based on an average value of the first signals and an average value of the second signals which the sampling device outputs in response to the trigger signals.
JP2002519675 | INDUSTRIAL APPLICABILITY: Skew correction means and skew correction method |
WO/2005/026755 | TEST APPARATUS |
WO/2009/028040 | TESTER AND MANUFACTURING METHOD |
JPS62282443A | 1987-12-08 | |||
JPS63119325A | 1988-05-24 |
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