Title:
INSPECTION DEVICE AND INSPECTION METHOD
Document Type and Number:
Japanese Patent JP2018021817
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide an inspection device and the like that can sufficiently classify a foreign matter in a sheet.SOLUTION: An inspection device includes: an imaging unit capable of photographing a sheet and obtaining a photographed result as image information; and a determination unit for determining whether a foreign matter should be removed on the basis of the image information obtained by the imaging unit. The determination unit determines a shape of the foreign matter, divides the shape of the foreign matter into a plurality of regions, calculates a feature quantity by the division region, determines whether the division regions should be removed, and determines the foreign matter on the basis of the number of division regions determined to be removed.SELECTED DRAWING: Figure 2
Inventors:
KONISHI TAKAHIRO
Application Number:
JP2016152999A
Publication Date:
February 08, 2018
Filing Date:
August 03, 2016
Export Citation:
Assignee:
NITTO DENKO CORP
International Classes:
G01N21/892; G01B11/02; G01B11/28; G06T1/00; G06T7/00
Attorney, Agent or Firm:
Noboru Fujimoto
Hiroaki Nakatani
Shinji Nitto
Hiroaki Nakatani
Shinji Nitto
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