To provide an inspection device for printed matter capable of detecting flaws that have reduced feature quantities, such as hickey defects, or the like, and to provide an inspection method for the printed matter.

The inspection device of the printed matter is constituted so as to acquire inspection luminance data 29-1 through inspection brightness data 29-n, with respect to a plurality of inspection regions 43 by an image acquisition part. In the inspection device of the printed matter, the moving average of the inspection luminance data 29-1 through 29-n acquired by an image inspection part is calculated, to form average inspection luminance data 39, the difference between the average inspection luminance data 39 and reference luminance data 41 is calculated to form average difference data and a region, where the difference value of the average difference data exceeds a predetermined threshold is detected as a flaw.