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Title:
Inspection device
Document Type and Number:
Japanese Patent JP6271384
Kind Code:
B2
Abstract:
According to one embodiment, a screening device (1, 2, 3, 4, 5, 6) includes a first antenna (12f, 15, 17, 17p) configured to transmit a first microwave (20) to a subject (±) to generate a second microwave (22) and a third microwave (21), the second microwave (22) being generated by a diffraction of the first microwave (20) at the subject (±), the third microwave (21) being a part of the first microwave (20) passing the subject (±), and a second antenna (14, 14v, 14p) configured to receive the second microwave (22) in a first period and to receive the third microwave (21) in a second period.

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Inventors:
Hiroyuki Kayano
Koji Shiokawa
Application Number:
JP2014191785A
Publication Date:
January 31, 2018
Filing Date:
September 19, 2014
Export Citation:
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Assignee:
Toshiba Corporation
International Classes:
G01N22/02; G01N22/00
Domestic Patent References:
JP2005501262A
JP2001086058A
JP5102904A
JP2007536506A
JP2000275289A
Foreign References:
US20050285772
US20100295725
Attorney, Agent or Firm:
Masahiko Hinataji



 
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